Semiconductor Engineering29 June 20262d ago

LLM-driven, Formal Verification-Assisted Framework For Functional-Safety-Oriented Fault Criticality Assessment (ASU, TI)

Researchers from Arizona State University and Texas Instruments India published a technical paper titled “SafeGen: LLM-Driven Assertion Generation and Fault Criticality Evaluation for Functional Safety.” Abstract Excerpt: “This paper presents SafeGen, an LLM-driven, formal-verification-assisted framework for functional-safety-oriented fault criticality assessment.” The paper also reports that “Saf

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